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HORIBA announces a new, entry-level multimodal characterization system for true simultaneous colocalized measurements
Introducing the SignatureSPM™: an automated AFM platform integrated with Raman spectroscopy for advanced nanotechnology ...
In this paper, we introduce the simultaneous and semi-alternating projection algorithms for solving the split equality problem by using a new choice of the step size and combining the alternated ...
Publishing in the journal International Journal of Extreme Manufacturing, the team led by researchers based at the State Key Laboratory of Fluid Power and Mechatronic Systems deposited different ...
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