Bump scaling is pushing defect inspection to the limit. What comes next and why it matters.

Scientists in China have developed a new deep learning model based on the so-called "You Only Look Once" algorithm, which requires only one forward propagation pass through the neural network to make ...

Researchers from the University of Naples and the University of Wollongong have developed an AI-based method that boosts ...

Abstract: Surface defects on lithium battery electrodes are typically small and diverse, which will impact battery performance and safety. Due to their morphological characteristics, traditional ...

Delvitech, a Deep Tech company specialising in the development of artificial intelligence (AI)-native automated optical ...