Abstract: Defect detection is a crucial but challenging task in thin film transistor liquid crystal display (TFT-LCD) manufacturing. Existing vision-based methods focus on either spatial domain or ...
Contents presented in the Microcontrollers Laboratory Course; Microcontrollers used: Arduino UNO R3 & DOIT ESP32 DEVKIT V1 - CSE Department, Shiraz University, Spring 2025.
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