It is well established that transition and stuck-at fault models detect the vast majority of production defects. The transition fault model focuses on detecting timing-related defects. However, the ...

My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...