The automatic detection of surface-level irregularities—defects or anomalies—in 3D data is of significant interest for ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Figure 1. Ultrasonic testing using pulse echo and through-transmission methods. Pulse echo (left and center) uses a transducer that sends and receives ultrasound energy, producing both A- and B-scan ...

This diagram depicts how metals with a smoother surface are less prone to the accumulation of hydrogen-induced defects, namely dislocations and vacancy clusters. As the world strives to achieve carbon ...

# Fuel cells, integral components of hydrogen fuel cell electric vehicles(FCEVs), serve as eco-friendly energy conversion systems that generate electric power and ...

Processing diamond surfaces with femtosecond lasers yields a trade-off between hydrophilicity and low defect rate.

Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...

Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...