Scan technology enables high levels of defect detection using automated tools. Each D flip-flop (DFF) or latch in the circuit under test is implemented as an equivalent sequential element called a ...

This in-depth discussion of scan-based testing explores the benefits, implementation, and possible problems of AC scan. Today�s large, complex chips present an entirely new set of test issues for ...

Boundary Scan technique is most often thought of as a board-level test method, but certain techniques makes system level test with JTAG quite effective. Many types of faults can arise when systems are ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...