Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...

Some supermarkets are taking a few hesitant steps toward scan-based trading of magazines, but many in the industry are starting to question whether the system, in which retailers pay for their ...

These days, there is a requirement of achieving high frequency targets with lower power consumption. Achieving both targets simultaneously is very difficult and the situation becomes even more complex ...

The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...

Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...