Electronic Design

Test System Supplier Helps Implement Accelerated Testing

The Direct Customer Advantage Program from QualMark Corp., Denver, Colo., offers on-line access to timely information to support accelerated reliability testing programs. Through the program, ...
EDN

Accel-RF system tests reliability of GaN devices

Joining a family of RF reliability test systems is the HiPR-AARTS (High Power RF Automated Accelerated Reliability Test System) from Accel-RF, intended to help manufacturers prove the reliability of ...
Semiconductor Engineering

Using Deep Data Analytics To Enhance Reliability Testing The Fast Roadmap for Zero Defects

proteanTecs and ELES have partnered together to enhance reliability testing with deep data analytics. This collaboration enables SoC manufacturers to improve their qualification envelope to achieve ...
Semiconductor Engineering

Reliability Comparison of 28 V – 50 V GaN-on-SiC S-Band and X-Band Technologies

Dig into the details of just how reliable are some GaN/AlGaN high electron mobility transistor (HEMT) MMIC released process technologies are for S-Band and X-Band. August 14th, 2019 - By: Wolfspeed, a ...