Driven by the rapid expansion of AI infrastructure, demand for Fiber Array Units (FAUs) and other passive optical components ...

Rochester Institute of Technology recently installed a MIRTEC MV3 OMNI automated, optical inspection machine in its Center for Electronics Manufacturing and Assembly (CEMA). The equipment enables ...

Jeff Johnson, mechatronics product manager, Beckhoff Automation Quality assurance bottlenecks are especially apparent when working with different components and in high-mix low-volume production. This ...

Green Optics is expanding its growth opportunities in the defense and semiconductor sectors, leveraging its advanced precision optical systems and opt ...

Building good automated models for inspection require more data to be collected, both good and bad. Vijay Thangamariappan, R&D engineer at Advantest, explains how to develop models for automating ...

Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...

Soaring AI/HPC device demand is driving leading-edge foundries to support the transition from wafers to panels to accommodate increasingly larger device sizes. But to ensure that panels with multiple ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

Veteran semiconductor equipment distributor Spirox has successfully entered the advanced packaging supply chain in the second half of 2025 with its self-developed advanced optical inspection equipment ...

Taiwan-based optical inspection equipment (AOI) supplier Utechzone expects to post impressive revenue growth this year, driven by robust demand from chipmaking and IC substrate clients that are ...

The semiconductor metrology and inspection equipment market, essential for advanced chip manufacturing, faces growing opportunities and challenges amid rising complexity and defect sensitivity in ...