Semiconductor Engineering

Are You Using Structural Patterns In An SLT Environment?

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...
Electronic Design

What’s The Difference Between Scan ATPG And IJTAG Pattern Retargeting?

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
EDN

Decreasing Cost-of-Test with Automatic Test-Pattern Generation

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on ICs continues to double every 18 to 24 ...
Semiconductor Engineering

Supporting Multiple Time Domains In SoC Production Test

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...