Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

IBM developer Nicholas Bourdakos recently created a new Code Pattern that lets just about anyone develop and train an AI model to recognize objects using computer vision. Bourdakos’ Code Pattern, ...

As integrated circuits accommodate ever more transistors, the number of test vectors needed to test logic ICs rises dramatically. Design-automation companies are pursuing two design-for-test (DFT) ...

IBM released the first software development patterns represented in code and integrated with tools for automating enterprise application development. Available on IBM's developerWorks Web site, the ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

To compete in the fast-growing market for automotive ICs, semiconductor companies need to address new challenges across the entire design flow. To meet the ISO 26262 goal of zero defective parts per ...