As VLSI technology scales to 90 nanometers and beyond, ASIC vendors increasingly see power grid integrity issues in their designs and in the field, for two primary reasons. First, deep-submicron ...

One of the more interesting detailed conversations at DAC this year was with Teklatech, a small Danish company supplying a tool to improve dynamic IR drop and clock noise problems. Unlike analysis ...

“With advanced semiconductor technology progressing well into sub-7nm scale, voltage drop has become an increasingly challenging issue. As a result, there has been extensive research focused on ...

A device may pass a static test with flying colors, but when put into a real-life situation it may still fail and break, and that's bad for anyone standing underneath. Why is dynamic drop testing ...