The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...

Tokyo Electron Ltd. (TEL) and Teseda Corp. today announced that they have combined efforts for an integrated design for testability (DFT) system. The demonstration system consists of the Wafer Prober ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...

Hardware engineers employ all kinds of design reviews and processes, including design for manufacturability and design for testability. It's time software engineers stood up and asked for what they ...

This paper discusses one of the Siemens EDA shift-left strategies in the RTL-to-signoff flow: shift-left design-for-test (DFT). Tessent RTL Pro software automates the analysis and insertion of Tessent ...

JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...