In industry, the task of defect classification and defect localization is an important part of defect detection system. However, existing studies only focus on one task and it is difficult to ensure ...

Extended defects such as dislocation networks and general grain boundaries are ubiquitous in metals, and accurate modeling these extensive defects is crucial to elucidate their deformation mechanisms.

A new technical paper titled “DECOR: Deep Embedding Clustering with Orientation Robustness” was published by researchers at Oregon State University and Micron Technology. “In semiconductor ...

Emergence of anti-hyperuniform defect organization in active nematics. At high activity (left), topological defects are distributed nearly uniformly throughout the system. Reducing activity toward a ...

The proposed framework consists of Varied Defect Synthesis (VDS) pseudo-anomaly generator, transformer-based backbone, voting network, and differentiable clustering module, enabling precise point- and ...