A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

NPR's Kelly McEvers talks with data scientist Cathy O'Neil about her new book, Weapons of Math Destruction, which describes the dangers of relying on big data analytics to solve problems. We are in a ...

Artificial intelligence (AI) is no longer a buzzword; it has become an integral part of our lives, influencing every aspect of society in ways we could only dream of just a few years ago. AI has made ...