Catching all defects in chip packaging is becoming more difficult, requiring a mix of electrical tests, metrology screening, and various types of inspection. And the more critical the application for ...
A technical paper titled “Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy” was published by researchers at ...
Recent research has found a new way to make graphene that adds structural defects to improve the performance of the material ...
This study is led by Prof. Shuangyin Wang (College of Chemistry and Chemical Engineering, Hunan University) and Prof. Chen Chen (College of Chemistry and Chemical Engineering, Hunan University).
An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize ...
Tech Xplore on MSN
AI-driven smart jig can detect micro-level defects in just 2.79 seconds
A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that ...
This patent from Jiejia Intelligent Manufacturing relates to a quality inspection method for automotive PCBA, utilizing a mid-wave infrared thermal imager to capture thermal field video streams of ...
Artificial intelligence-powered large language models (LLM) need to be trained on massive datasets to make accurate ...
DARPA has awarded Auburn's NCAME up to $2.8M over four years to support its Structures Uniquely Resolved to Guarantee ...
When used during the growth process, Azupyrene helps form graphene-like films that are rich in these controlled defects. One ...
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